4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Gary Robert Waggoner

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Serial scan chain control within an integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Supporting scan functions within memories

Static information storage and retrieval – Read/write circuit – With shift register
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3241739

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