4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Quality evaluation

Fu-Kang Lai

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Algorithms tunning for dynamic lot dispatching in wafer and...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Method for minimizing total test time for testing factories

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2505879

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