4. Semiconductor device manufacturing: process
  5. Introduction of conductivity modifying dopant into...

François J. R. Clèment

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IC substrate noise modeling with improved surface gridding...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method for modeling noises in an integrated circuit

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into...
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2040875

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