4. Static information storage and retrieval
  5. Read/write circuit
  6. Differential sensing

Francesco Pipitone

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Built-in testing methodology in flash memory

Static information storage and retrieval – Read/write circuit – Testing
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Circuit for controlling a reference node in a sense amplifier

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2760296

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