4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Physical configuration of semiconductor
  6. Groove

Florian Pschenitzka

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Determining leakage in matrix-structured electronic devices

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Integrated fuses for OLED lighting device

Electric lamp and discharge devices – With luminescent solid or liquid material – Solid-state type
Reexamination Certificate

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Interfacial trap layer to improve carrier injection

Active solid-state devices (e.g. – transistors – solid-state diode – Organic semiconductor material
Reexamination Certificate

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Modification of polymer optoelectronic properties after film...

Coating processes – Electrical product produced – Fluorescent or phosphorescent base coating
Reexamination Certificate

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Printable electric circuits, electronic components and...

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – Groove
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2295514

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