4. Measuring and testing
  5. Surface and cutting edge testing

Fabrizio Ghironi

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Process of manufacturing a composite structure for...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...
Reexamination Certificate

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Quantitative assessment of the geometrical distortion suffered b

Measuring and testing – Surface and cutting edge testing
Patent

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Structure for electrically connecting a first body of...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1294621

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