4. Single-crystal, oriented-crystal, and epitaxy growth processes;
  5. Processes of growth from liquid or supercritical state
  6. Having pulling during growth

Eiji Tokizaki

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Measuring device for density of liquid or high-temperature melt

Measuring and testing – Specific gravity or density of liquid or solid – With weighing feature
Patent

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Pull method for growth of single crystal using density detector

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Having pulling during growth
Patent

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Profile ID: LFUS-PAI-P-1151798

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