4. Electrical transmission or interconnection systems
  5. Personnel safety or limit control features
  6. Interlock

Durbin L. Seidel

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Apparatus and method for testing integrated circuit devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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CMOS power fet driver including multiple power MOSFET transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent

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Method for testing integrated circuit devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Sample-and-hold switch with low on resistance and reduced charge

Electrical transmission or interconnection systems – Personnel safety or limit control features – Interlock
Patent

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Profile ID: LFUS-PAI-P-1450095

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