4. Television
  5. Special applications
  6. Flaw detector

Douglas Y. Kim

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Advanced via inspection tool (AVIT)

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Automatic threshold level structure for calibrating an inspectio

Television – Special applications – Flaw detector
Patent

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Method and apparatus for object inspection

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-863658

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