4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Clock or pulse waveform generating

Doug Feist

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High-speed TDF testing on low cost testers using on-chip...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Clock or pulse waveform generating
Reexamination Certificate

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High-speed TDF testing on low cost testers using on-chip...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Clock or pulse waveform generating
Reexamination Certificate

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Technique for measurement of programmable termination...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2359472

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