4. Optics: measuring and testing
  5. By dispersed light spectroscopy
  6. With sample excitation

David T. Dutton

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Attachment system incorporating a recess in a structure

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – Groove
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Microplasma-based sample ionizing device and methods of use...

Radiant energy – Ionic separation or analysis – With sample supply means
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Surface contamination detection

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
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