4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

David Leslie Heald

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Interferometric modulation devices having triangular subpixels

Optical: systems and elements – Optical modulator – Light wave temporal modulation
Reexamination Certificate

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Method and apparatus for wafer-level testing of...

Optics: measuring and testing – For light transmission or absorption
Reexamination Certificate

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Method and apparatus for wafer-level testing of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2454550

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