4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

David L. Carnahan

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Apparatus and method for nanoscale pattern generation

Semiconductor device manufacturing: process – Masking
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of producing a branched carbon nanotube for use with...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Nanoscale grasping device, method for fabricating the same,...

Electricity: electrical systems and devices – Electric charge generating or conducting means – Use of forces of electric charge or field
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

David L. Carnahan does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with David L. Carnahan, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and David L. Carnahan will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2854276

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure