4. Optics: measuring and testing
  5. By alignment in lateral direction
  6. With light detector

David Foley

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Electro-static discharge and latchup resistant semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Method and apparatus for object alignment

Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Reexamination Certificate

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Process and device for determining the center-line of a curvatur

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Profile ID: LFUS-PAI-P-1834586

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