4. Semiconductor device manufacturing: process
  5. With measuring or testing

David Eric Trémouilles

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Design methodology for MuGFET ESD protection devices

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method for calibrating an electrostatic discharge tester

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
Reexamination Certificate

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Method of measuring characteristic impedance of...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Profile ID: LFUS-PAI-P-2339745

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