4. Electricity: power supply or regulation systems
  5. Self-regulating
  6. Using a three or more terminal semiconductive device as the...

David Boerstler

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Method of extract gate delay parameter in high frequency...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Voltage controlled current source for low voltage applications

Electricity: power supply or regulation systems – Self-regulating – Using a three or more terminal semiconductive device as the...
Patent

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Profile ID: LFUS-PAI-P-470774

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