4. Supports: racks
  5. Specially mounted
  6. Wall or window

Daniel S. Lee

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Built-in self-testing for embedded memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Clothing rack and hanger composite structure

Supports: racks – Specially mounted – Wall or window
Patent

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Profile ID: LFUS-PAI-P-535606

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