4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Daniel Ray Knebel

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Image processing methods for the optical detection of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method for identifying long paths in integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Using time resolved light emission from VLSI circuit devices...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1849279

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