4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Mechanical measurement system

Chung-Ho Huang

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Automatic dynamic baseline creation and adjustment

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
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Component-tracking system and methods therefor

Data processing: database and file management or data structures – Data warehouse – data mart – online analytical processing ,... – Tools to automate schema definition process
Reexamination Certificate

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Dynamic component-tracking system and methods therefor

Data processing: database and file management or data structures – Data warehouse – data mart – online analytical processing ,... – Tools to automate schema definition process
Reexamination Certificate

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Etch endpoint detection

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
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Integrated electronic hardware for wafer processing control...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Profile ID: LFUS-PAI-P-2243447

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