4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Chun-Tao Li

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Metal fill region of a semiconductor chip

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Method for evaluating storage cell design using a wordline...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3159837

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