4. Optics: measuring and testing
  5. By polarized light examination
  6. With light attenuation

Chuji Itagaki

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Method and apparatus for detecting minute irregularities on the

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method and apparatus for detecting minute irregularities on the

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method and apparatus for detecting minute irregularities on...

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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