4. Electronic digital logic circuitry
  5. Clocking or synchronizing of logic stages or gates

Chizuru Inoshita

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Method for testing a semiconductor integrated circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Method for testing a semiconductor integrated circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method for testing a semiconductor integrated circuit when a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method for testing a semiconductor integrated circuit when a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Power conserving CMOS semiconductor integrated circuit

Electronic digital logic circuitry – Clocking or synchronizing of logic stages or gates
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2432141

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