4. Measuring and testing
  5. Surface and cutting edge testing

Ching-I Kuo

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Anti-leakage apparatus

Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering
Patent

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Tool for inspecting broken wafer edges

Measuring and testing – Surface and cutting edge testing
Patent

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Profile ID: LFUS-PAI-P-1786570

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