4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Chih-Wea Wang

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Built-in programmable self-diagnostic circuit for SRAM unit

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Built-in programmable self-diagnostic circuit for SRAM unit

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Multi-port memory testing method utilizing a sequence...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2554633

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