4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Chih-Jen M. Lin

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Flexible scan architecture

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and apparatus for testing a memory array

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Method and apparatus for testing a memory array

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2418985

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