4. Semiconductor device manufacturing: process
  5. With measuring or testing

Chia-Yen Cha

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Method and system for determining the fail patterns of...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method for prioritizing failure modes to improve yield rate...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2103295

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