4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Chi-Feng Huang

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Camera

Photography and optical equipment – Camera or body therefor – Separate lens and viewfinder
Design Patent

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Camera

Photography and optical equipment – Camera or body therefor – Separate lens and viewfinder
Design Patent

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Circuit and method for detecting faulty diode

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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High density stacked MIM capacitor structure

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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High density stacked mim capacitor structure

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2211819

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