4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Combined with electrical contact or lead
  6. Solder wettable contact, lead, or bond

Cher Khng Victor Tan

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Method and apparatus for detecting topographical features of...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Method and apparatus for detecting topographical features of...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Method and apparatus for detecting topographical features of...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Methods for designing carrier substrates with raised terminals

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate

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Methods of forming semiconductor assemblies

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2700165

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