4. Stock material or miscellaneous articles
  5. Composite
  6. Of silicon containing

Chengzhi Cai

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Modification of silicon-containing scanning probe microscopy...

Stock material or miscellaneous articles – Composite – Of silicon containing
Reexamination Certificate

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Short and thin silicon cantilever with tip and fabrication...

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3036066

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