4. Electronic digital logic circuitry
  5. Clocking or synchronizing of logic stages or gates
  6. Field-effect transistor

Casimer K Salys

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Method and apparatus for measuring device mismatches

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Multistage, single-rail logic circuitry and method therefore

Electronic digital logic circuitry – Clocking or synchronizing of logic stages or gates – Field-effect transistor
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2704720

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