4. Optics: measuring and testing
  5. By polarized light examination
  6. With light attenuation

Carleton H. Seager

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Measurement of the curvature of a surface using parallel light b

Optics: measuring and testing – By polarized light examination – With light attenuation
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Method for restoring the resistance of indium oxide semiconducto

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
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Micromachined silicon electrostatic chuck

Electricity: electrical systems and devices – Electric charge generating or conducting means – Use of forces of electric charge or field
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Profile ID: LFUS-PAI-P-631054

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