4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Performance or efficiency evaluation

Byung-Seol Ahn

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Apparatus and method for inspecting patterns on wafers

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for classifying repetitive defects on a...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Byung-Seol Ahn does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Byung-Seol Ahn, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Byung-Seol Ahn will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2982426

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure