4. Coded data generation or conversion
  5. Converter calibration or testing

Byeong-Hwan Cho

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Apparatus and method for testing linearity of an analog to...

Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate

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Semiconductor device test method for optimizing test time

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Socket, and test apparatus and method using the socket

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2660602

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