Measuring and testing
Surface and cutting edge testing
Roughness
Inventor
active
Atomic force microscope system with cantilever having unbiased s
EMR magnetic sensor having its active quantum well layer...
Enhanced magnetoresistance and localized sensitivity by...
Exchange-coupled magnetoresistive sensor with a coercive...
Heterogeneous spacers for CPP GMR stacks
No associations
LandOfFree
Bruce Alvin Gurney does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Bruce Alvin Gurney, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Bruce Alvin Gurney will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-1056991