4. Electronic digital logic circuitry
  5. Function of and, or, nand, nor, or not
  6. Field-effect transistor

Bradley D. Pace

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Apparatus and method for testing integrated circuit devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Differential CMOS logic family

Electronic digital logic circuitry – Function of and – or – nand – nor – or not – Field-effect transistor
Patent

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Method for testing integrated circuit devices

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1985661

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