4. Electrical computers and digital processing systems: memory
  5. Address formation
  6. Generating a particular pattern/sequence of addresses

Bill Sopkin

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Fail array memory control circuit with selective input disable

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Pattern generator for a packet-based memory tester

Electrical computers and digital processing systems: memory – Address formation – Generating a particular pattern/sequence of addresses
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2438376

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