4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Babak H. Khalaj

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Automated direct patterned wafer inspection

Image analysis – Applications – Manufacturing or product inspection
Patent

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Single ended line probing in DSL system

Telephonic communications – Diagnostic testing – malfunction indication – or electrical... – Of data transmission
Reexamination Certificate

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Profile ID: LFUS-PAI-P-858552

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