4. Optics: measuring and testing
  5. For optical fiber or waveguide inspection

Atsuko Ohkawa

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Thickness/depth measuring apparatus and method for measuring the

Optics: measuring and testing – For optical fiber or waveguide inspection
Patent

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Thin film magnetic head having non-linear rails

Dynamic magnetic information storage or retrieval – Record transport with head stationary during transducing – Drum record
Patent

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Thin film magnetic head having non-linear tapered rails

Dynamic magnetic information storage or retrieval – Fluid bearing head support – Disk record
Reexamination Certificate

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Thin film magnetic head, process for production thereof

Etching a substrate: processes – Forming or treating article containing magnetically...
Patent

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Profile ID: LFUS-PAI-P-394909

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