4. Electric lamp and discharge devices
  5. With temperature modifier
  6. For envelope wall

Aseem Kumar Srivastava

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Contact temperature probe and process

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate

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Device for cooling electrodeless lamp with supersonic outlet jet

Electric lamp and discharge devices – With temperature modifier – For envelope wall
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Method and apparatus for micro-jet enabled, low energy ion...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate

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Method and apparatus for micro-jet enabled, low-energy ion...

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With multiple gas energizing means associated with one...
Reexamination Certificate

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Profile ID: LFUS-PAI-P-906162

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