4. Excavating

Arun K. Gunda

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Defect isolation using scan-path testing and electron beam probi

Excavating
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Method of analyzing static current test vectors with reduced...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Testing a circuit with compressed scan chain subsets

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Profile ID: LFUS-PAI-P-522288

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