4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Anupama Aniruddha Agashe

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At-speed ATPG testing and apparatus for SoC designs having...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Mechanism to enhance observability of integrated circuit...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Mixed-signal core design for concurrent testing of...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2877244

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