4. Thermal measuring and testing
  5. Temperature measurement
  6. By electrical or magnetic heat sensor

Andrew Neely

Inventor

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Model test apparatus and method

Measuring and testing – Specimen model or analog
Reexamination Certificate

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Multiple-phase clock signal generator for integrated circuits, c

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Clock or pulse waveform generating
Patent

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On chip noise tolerant temperature sensing circuit

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent

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Profile ID: LFUS-PAI-P-1080110

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