4. Abrading
  5. Precision device or process - or with condition responsive...
  6. Computer controlled

Andrew J. Krivy

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Calibration target for calibrating semiconductor wafer test...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Calibration target for calibrating semiconductor wafer test...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Method for cleaning semiconductor device probe

Abrading – Precision device or process - or with condition responsive... – With indicating
Reexamination Certificate

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Method for fabricating calibration target for calibrating...

Etching a substrate: processes – Etching of semiconductor material to produce an article...
Reexamination Certificate

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Method for testing semiconductor wafers

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1109688

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