4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Andreas Glowatz

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Arrangement and method of testing an integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and system for selectively masking test responses

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and system for selectively masking test responses

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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Profile ID: LFUS-PAI-P-2391760

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