4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Measured signal processing

Amit Mehrotra

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Method and apparatus for characterizing phase noise and timing j

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Patent

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System chip synthesis

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1167225

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