4. Coded data generation or conversion
  5. Digital code to digital code converters
  6. To or from interleaved format

Ali Najafi

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Bist for parallel testing of on chip memory

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Modulation coding based on an ECC interleave structure

Coded data generation or conversion – Digital code to digital code converters – To or from interleaved format
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2789412

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