4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Ajay Pai

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Method for identification of cotton contaminants with x-ray...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Wafer edge inspection and metrology

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Wafer edge inspection and metrology

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2331126

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