4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Temperature measuring system

Agersonn Rall Group, L.L.C.

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Semiconductor device having variable parameter selection...

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Temperature sensing circuit with hysteresis and time delay

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate

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