4. Optics: measuring and testing
  5. Inspection of flaws or impurities

Aditya Dayal

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Defect detection via multiscale wavelets-based algorithms

Image analysis – Applications – Manufacturing or product inspection
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Surface inspection system and method using summed light...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2971477

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