4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Calibration

Adam J. Wright

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Circuits and method for bypassing a static configuration in...

Electronic digital logic circuitry – Multifunctional or programmable – Array
Reexamination Certificate

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Method and apparatus for debugging semiconductor devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and apparatus for minimizing skew between signals

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2218282

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